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A JEOL 2200FS transmission electron microscope equipped with a field emission gun, an objective lens spherical aberration corrector and an in-column energy filter has been used to acquire through focal series of high-resolution images of platinum nanocatalyst particles using a small value of the spherical aberration coefficient. The degree to which spherical aberration correction provides an improvement to image quality and interpretability for such particles is discussed, both with and without the use of through-focal series restoration. © 2006 IOP Publishing Ltd

The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles