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This paper presents a generalized reliability assessment model for complex electronic equipment with multivariate competing failure. The key of multivariate competing failure model is separated into two parts, multi-degradation measure probability density function (MDM-PDF) and traumatic failure reliability function (TFRF) related to degradation level. Principal component analysis is used to solve the calculation problem of MDM-PDF; Logistic function and least square method are introduced to solve the problem of TFRF. Finally, a case study of sine-wave oscillation circuit is given to validate the effectiveness of the model.

Reliability Assessment Method of Complex Electronic Equipment with Multivariate Competing Failure