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Synopsis Total cross sections (TCS) for low-energy electron scattering from X(CH 3 ) 4  (where X = C, Si, Ge) molecules have been measured using linear transmission method. Present results and those obtained previously for XH 4  molecules were used to determine how methylation of the target is reflected in TCS energy dependence.

Role of methylation in electron scattering on X(CH3)4 (X = C, Si, Ge) molecules