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We have investigated ferroelectric charged domains in polycrystalline hexagonal yttrium manganite thin films (Y 1 Mn 1 O 3 , Y 0.95 Mn 1.05 O 3 , Y 1 Mn 0.99 Ti 0.01 O 3 , and Y 0.94 Mn 1.05 Ti 0.01 O 3 ) by scanning electron microscopy (SEM) in secondary electron emission mode with a small acceleration voltage. Using SEM at an acceleration voltage of 1.0 kV otherwise homogenous surface charging effects are reduced, polarization charges can be observed and polarization directions (±P z ) of the ferroelectric domains in the polycrystalline thin films can be identified. Thin films of different chemical composition have been deposited by pulsed laser deposition on Pt/SiO 2 /Si structures under otherwise same growth conditions. Using SEM it has been shown that different charged domain density networks are existing in polycrystalline yttrium manganite thin films.

Charged domains in ferroelectric, polycrystalline yttrium manganite thin films resolved with scanning electron microscopy