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Real-time monitoring of 2D semiconductor film growth with optical spectroscopy
Author(s) -
Yaxu Wei,
Wanfu Shen,
Dietmar Roth,
Sen Wu,
Chunguang Hu,
Yanning Li,
Chunguang Hu,
M. Hohage,
Peter BauerGottwein,
Lidong Sun
Publication year - 2017
Publication title -
nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.926
H-Index - 203
eISSN - 1361-6528
pISSN - 0957-4484
DOI - 10.1088/1361-6528/aa8943
Subject(s) - materials science , semiconductor , sapphire , monolayer , optoelectronics , bilayer , thin film , spectroscopy , molecular beam epitaxy , optics , diselenide , epitaxy , laser , nanotechnology , layer (electronics) , chemistry , selenium , biochemistry , metallurgy , quantum mechanics , membrane , physics

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