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This paper reports the nanoscale texture and microstructure of ahigh-performance NdFeAs(O,F) superconducting thin film grown by molecular beamepitaxy on a textured MgO/Y$_2$O$_3$/Hastelloy substrate. The NdFeAs(O,F) filmforms a highly textured columnar grain structure by epitaxial growth on the MgOtemplate. Although the film contains stacking faults along the $ab$-plane aswell as grain boundaries perpendicular to the $ab$-plane, good superconductingproperties are measured: a critical temperature, $T _{\rm c}$, of 46 K and aself-field critical current density, $J_{\rm c}$, of $2 \times 10^6 \,{\rmA/cm^2}$ at 4.2 K. Automated crystal orientation mapping by scanning precessionelectron diffraction in transmission electron microscopy is employed to analyzethe misorientation angles between adjacent grains in a large ensemble (247grains). 99% of the grain boundaries show in-plane misorientation angles($\Delta \gamma$) less than the critical angle $\theta_{\rm c}$, whichsatisfies one of the necessary conditions for the high $J_{\rm c}$. Comparingthe columnar grain size distribution with the mean distance of the flux linelattice, the triple junctions of low-angle grain boundaries are found to beeffective pinning centers, even at high temperatures ($\ge$35 K) and/or lowmagnetic fields.

Nanoscale Texture and Microstructure in NdFeAs(O,F)/IBAD-MgO Superconducting Thin Film with Superior Critical Current Properties