Open AccessBias-dependent photo-detection of dual-ion beam sputtered MgZnO thin films
Author(s) -
Saurabh Kumar Pandey,
Shaibal Mukherjee
Publication year - 2016
Publication title -
bulletin of materials science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.35
H-Index - 72
eISSN - 0973-7669
pISSN - 0250-4707
DOI - 10.1007/s12034-015-1131-5
Subject(s) - materials science , photosensitivity , thin film , wurtzite crystal structure , crystallite , x ray photoelectron spectroscopy , sputtering , biasing , optoelectronics , substrate (aquarium) , analytical chemistry (journal) , single crystal , optics , crystallography , voltage , nanotechnology , nuclear magnetic resonance , chemistry , oceanography , physics , quantum mechanics , zinc , chromatography , geology , metallurgy
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