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New measurements and observations on aged NaI detectors
Author(s) -
Tartari A.,
Di Domenico G.,
Bonifazzi C.,
Baraldi C.
Publication year - 2009
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1140
Subject(s) - detector , monte carlo method , spectral line , photon , interference (communication) , radiation , dead time , physics , optics , resolution (logic) , materials science , computational physics , statistics , computer science , mathematics , channel (broadcasting) , quantum mechanics , astronomy , artificial intelligence , computer network
Abstract The dead layer near the front surface of aged or damaged NaI detectors produces both an energy dependent diminution in counting efficiency and a characteristic iodine K x‐ray peak, which interferes with the registered radiation spectra. In this paper, the exploitation of this peak as an internal reference to assess the dead layer thickness and the relative loss of detector quality is proved by means of a comparison between experiments and Monte Carlo simulations. Investigations with different NaI‐based equipments and photon transport simulations are carried out in order to assess the detector degradation in terms of peak interference, efficiency and resolution. Copyright © 2009 John Wiley & Sons, Ltd.