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Electronic and structural characterization of electrochemically synthesized conducting polyaniline from XPS studies
Author(s) -
Kumar S. N.,
Bouyssoux G.,
Gaillard F.
Publication year - 1990
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740150906
Subject(s) - bipolaron , polyaniline , x ray photoelectron spectroscopy , electrochemistry , polaron , amine gas treating , materials science , characterization (materials science) , salt (chemistry) , chemical engineering , chemistry , nanotechnology , electrode , organic chemistry , polymer , polymerization , physics , composite material , quantum mechanics , engineering , electron
Abstract We report high‐resolution XPS data on three forms of the electrochemically synthesized polyaniline films: the highly conducting emeraldine salt form and the films obtained after KOH treatment and electrochemical reduction in HCI. The deconvoluted N 1s peaks in these films show clear evidence of the existence of the existence of four states of nitrogen, which are attributed to the amine, polaron and localized bipolaron defect configurations. The trends observed after the KOH treatment and electrochemical reduction in HCI in the N 1s spectra, plus the C 1s and O 1s peak shapes, support this assignment scheme.

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