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P‐9: Understanding Diffusion Behaviors of Light Elements in OLEDs
Author(s) -
HAN Jae Bum,
Park Young-Gil,
Jeong Soo Im,
Ahn Nari
Publication year - 2021
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.14882
Subject(s) - diffusion , outgassing , materials science , sample (material) , hydrogen , optoelectronics , oled , analytical chemistry (journal) , ion , nanotechnology , chemistry , physics , thermodynamics , chromatography , layer (electronics) , organic chemistry
In the OLED panel, we have been investigated to understand diffusion behaviors of light element in various perspectives. It has evaluated by using advanced analytical tools such nano‐SIMS. we could find the diffused hydrogen from insulating film in channel area of bad sample. Increased hydrogen is directly attributed to the negative Vth shift. Also, we make the cross sectional sample and find the diffusion source of internal outgassing using the cross‐sectional Ion Mapping analysis method.