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Abstract  Co 2 MnSi (CMS) films of different thicknesses (20, 50, and 100 nm) were grown by radio frequency (RF) sputtering on  a ‐plane sapphire substrates. Our X‐rays diffraction (XRD) study shows that, in all the samples, the cubic 〈110〉 CMS axis is normal to the substrate and that six well defined preferential in‐plane orientations are present. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and microstrip line ferromagnetic resonance (MS‐FMR), respectively. From the resonance measurements  versus  the direction and the amplitude of an applied magnetic field, most of the magnetic parameters are derived, i.e.: the magnetization, the gyromagnetic factor, the exchange stiffness coefficient, and the magnetic anisotropy terms. The in‐plane anisotropy results from the superposition of two terms showing a twofold and a fourfold symmetry, respectively. The observed behavior of the hysteresis loops is in agreement with this complex form of the in‐plane anisotropy.

Structural and magnetic properties of Co 2 MnSi thin films