Prevalence of atrial high‐rate episodes and the risk factors in Indian patients with cardiac implantable electronic devices: Real‐world data

Abstract Background In patients with cardiac implantable electronic devices (CIEDs), atrial high‐rate episodes (AHREs) are associated with an increased risk of developing atrial fibrillation (AF) and thromboembolism. We report here the characteristics of “real‐world” patients that may be associated with the occurrence of AHREs. Methods This was an observational, cross‐sectional, data collection study. Data of 234 patients with dual‐chamber CIEDs, who visited our clinic over a period of 3 months, were evaluated. Occurrence of AHRE was defined as atrial tachyarrhythmia with an atrial rate of ≥180 beats/min lasting for ≥5 minutes. Multivariate logistic regression analyses were performed to evaluate clinical risk factors associated with AHRE. Results The mean age of the group was 66.9 ± 9.95 years, and 25% were females. AHREs were recorded in 48 (21%) patients. Multivariate logistic regression analysis revealed that hypertension (HTN) (OR = 4.14; 95% CI: 1.74‐9.85; P  = .0013) and type II diabetes mellitus (T2DM) (OR = 2.09; 95% CI: 1.04‐4.23; P  = .0392) were significantly and independently associated with the occurrence of AHRE. Conclusion This real‐world data report the prevalence of and risk factors associated with AHRE occurrence in Indian patients with dual‐chamber CIED. Known risk factors for AF, such as HTN and diabetes mellitus, were also associated with AHRE occurrence, thus supporting the risk prediction for AF, stroke, or thromboembolism in such patient population.