A general method for small‐signal circuit analysis considering thermal effects

It is well known that the behaviour of integrated circuits is strongly affected by thermal feedback. A general method for evaluating, by linear analysis, the complete circuit performance is described that considers these effects. The procedure can easily be implemented using only well known computer programs for the circuit analysis. Simple models for a number of devices (diodes, transistors and f.e.t.s) used in integrated circuits are given. Examples, using the circuit‐analysis program ECAP, are shown.