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Determination of the Rotational Viscosity and of the Elastic Constant from Measurements of Switching Times and Threshold Voltage on Planar Oriented S c Phases
Author(s) -
Dierking I.,
Giesselmann F.,
Zugenmaier P.,
Pelzl G.,
Schiller P.
Publication year - 1992
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170270529
Subject(s) - planar , tilt (camera) , constant (computer programming) , viscosity , dielectric , anisotropy , rotational viscosity , fréedericksz transition , materials science , voltage , condensed matter physics , threshold voltage , optics , liquid crystal , physics , geometry , optoelectronics , composite material , mathematics , quantum mechanics , computer graphics (images) , transistor , computer science , programming language
Abstract The Freedericksz transition of planar oriented S c phases was studied experimentally with an electrooptical method and the theoretically predicted reorientation along the S c tilt cone confirmed. Measurements of the threshold voltage and the switching times lead to the determination of the rotational viscosity and the elastic constant for five selected compounds with positive dielectric anisotropy.