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Engineering modal dispersions of ultrathin, planar structures enables significant control over infrared perfect absorption (PA) and thermal emission characteristics. Herein, the optical response of ultrathin, low loss, epsilon‐near‐zero (ENZ) films on reflecting surfaces is simulated to investigate the wavelength and angular ranges over which they absorb and emit radiation most efficiently and identify the design parameters that tailor the ENZ mode dispersion of the system. A generic interference model is shown to elucidate the underlying physics of these ultrathin film absorption resonances, occurring well below the conventional quarter‐wavelength thickness limit. While the absorption is spectrally limited to wavelengths where the ENZ film is optically a dielectric with refractive index below unity, the angular spread is delimited by the material dispersion. Further, these resonant interferences are understood to arise from universal wave phenomena, realizable in simple planar structures having appropriate refractive index contrast, not restricted to ENZ materials. The results show that appropriate choice of material, film thickness and loss allows tailoring the modal dispersions, which enables precise directional control and wide tunability in spectral range (width ≈0.1–1.0 μm) of PA and thermal emission, paving the way towards efficient ENZ‐based infrared optical and thermal coatings.

Tailoring Infrared Absorption and Thermal Emission with Ultrathin Film Interferences in Epsilon‐Near‐Zero Media