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This study presents a measurement method for determining the figure of meritfor transverse thermoelectric conversion ($ z_\mathrm{T}T $) in thin filmforms. Leveraging the proposed methodology, we comprehensively investigate thetransverse thermoelectric coefficient ($ S_\mathrm{T} $), in-plane electricalconductivity ($ \sigma_{yy} $), and out-of-plane thermal conductivity ($\kappa_{xx} $) in epitaxial and polycrystalline Fe/Pt metallic multilayers. The$ \kappa_{xx} $ values of multilayers with a number of stacking repetitions ($N $) of 200 are lower than those of FePt alloy films, indicating that themultilayer structure effectively contributes to the suppression of $\kappa_{xx} $. $ z_\mathrm{T}T $ is found to increase with increasing $ N $,which remarkably reflects the $ N $-dependent enhancement of the $ S_\mathrm{T}$ values. Notably, $ S_\mathrm{T} $ and $ \sigma_{yy} $ are significantlylarger in the epitaxial multilayers than those in the polycrystallinecounterparts, whereas negligible differences in $ \kappa_{xx} $ are observedbetween the epitaxial and polycrystalline multilayers. This discrepancy in $\sigma_{yy} $ and $ \kappa_{xx} $ with respect to crystal growth is due to thedifferent degree of anisotropy in electron transport between epitaxial andpolycrystalline multilayers, and epitaxial growth can lead to an enhancement of$ z_\mathrm{T}T $ in the multilayers. This study is the first demonstration inthe evaluation of $ z_\mathrm{T}T $ in thin film forms, and our proposedmeasurement technique reveals the transverse thermoelectric properties inherentto multilayers.

Quantitative measurement of figure of merit for transverse thermoelectric conversion in Fe/Pt metallic multilayers