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Recent advances in far-infrared detector technology have led to increases inraw sensitivity of more than an order of magnitude over previousstate-of-the-art detectors. With such sensitivity, photon noise becomes thedominant noise component, even when using cryogenically cooled optics, unless amethod of restricting the spectral bandpass is employed. The leading instrumentconcept features reflecting diffraction gratings which post-disperse the lightthat has been modulated by a polarizing Fourier transform spectrometer (FTS)onto a detector array, thereby reducing the photon noise on each detector. Thispaper discusses the development of a cryogenic (4 K) diffraction gratingspectrometer which operates over the wavelength range from\SIrange{285}{500}{\micro \meter} and was used to post-disperse the output froma room-temperature polarizing FTS. Measurements of the grating spectralresponse and diffraction efficiency are presented as a function of bothwavelength and polarization to characterize the instrumental performance.

Development and validation of a cryogenic far-infrared diffraction  grating spectrometer used to post-disperse the output from a Fourier  transform spectrometer