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The measurement of adhesion energy between nanolayers and substrates holdssignificant importance for the design, fabrication, and stability assessment ofmicro-/nanoscale devices relying on nanolayers. In this study, we propose ananowire-supported bridging method based on an optical microscope-basednanomanipulation technique to quantitatively measure the adhesion energybetween nanolayers and substrates. Using this innovative approach, we conductedadhesion energy measurements between mica nanolayers and Si substrates,revealing a value of approximately 110 J/m2. Additionally, we discuss theapplicable conditions of this new method. The proposed technique allowsmeasurements in atmospheric conditions and is, in principle, applicable to alltypes of nanolayers and substrates. Consequently, it holds promise as auniversal method for assessing adhesion energy between nanolayers andsubstrates, considering environmental factors such as atmosphere and roughness.

Quantitative Measurement of adhesion energy between nanolayers and substrates using a nanowire-supported bridging method