English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Results in this paper present an in-depth study of time resolution for activepixels of the RD50-MPW2 prototype CMOS particle detector. Measurementtechniques employed include Backside- and Edge-TCT configurations, in additionto electrons from a $^{90}\mathrm{Sr}$ source. A sample irradiated to $5\cdot10^{14}\,\mathrm{n}_\mathrm{eq}/\mathrm{cm}^2$ was used to study the effect ofradiation damage. Timing performance was evaluated for the entire pixel matrixand with positional sensitivity within individual pixels as a function of thedeposited charge. Time resolution obtained with TCT is seen to be uniformthroughout the pixel's central region with approx. $220\,\mathrm{ps}$ at$12\,\mathrm{ke}^-$ of deposited charge, degrading at the edges and lowervalues of deposited charge. $^{90}\mathrm{Sr}$ measurements show a slightlyworse time resolution as a result of delayed events coming from the peripheralareas of the pixel.

Measurements of time resolution of the RD50-MPW2 DMAPS prototype using TCT and $^{90}\mathrm{Sr}$