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We investigate the crosstalk between Transition-Edge Sensor (TES) pixels in aprototype 24-pixel hard X-ray array fabricated at the Advanced Photon Source,Argonne National Laboratory. Analysis shows thermal cross talk, possiblyassociated with insufficient thermalization, and rare but large in magnitudeelectrical crosstalk between specific perpetrator-victim pixel combinations,potentially due to deficiencies in the bias wiring or microwave multiplexingcircuit. We use a method based on group triggering and averaging to isolate thecrosstalk response despite only having access to X-ray photon illuminationuniform across the entire array. This allows us to identify thermal andelectrical crosstalk between pixel pairs in repeated measurements to the levelof 1 part in 1000 or better. In the array under study, the magnitude ofobserved crosstalk is small but comparable to the resolving power of this pixeldesign (E/$\Delta$E $\sim$ 1000 at 20 keV) and so potentially responsible for adegradation in energy resolution of the array at high incident photon rates.Having proven the methods to identify and quantify crosstalk in our setup, wecan consider mitigations.

Signatures of Thermal and Electrical Crosstalk in a Microwave Multiplexed Hard X-ray Transition Edge Sensor Array