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Dark field X-ray microscopy (DXFM) has enabled experiments to visualizemicrostructural distortions in bulk crystals. Using the femtosecond X-raypulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-umspatial resolution and <100 fs time resolution simultaneously. In this paper,we present the first ultrafast DFXM measurements at the European XFEL. In thiswork, we demonstrate DFXM of laser-induced phonon wavepackets propagatingthrough dislocations inside a diamond single crystal. In addition todemonstrating this new capability, we present two new DFXM scanning techniquesfor XFEL applications, 3D and axial-strain scans with sub-{\mu}m spatialresolution. With this progress to XFEL DFXM, we discuss new opportunities tostudy multi-timescale spatio-temporal dynamics of defects, strain waves, andother localized phenomena deep inside crystals.

Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser