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Resolving single atoms in large-scale volumes has been a goal for atomicresolution microscopy for a long time. Electron microscopy has come close tothis goal using a combination of advanced electron optics and computationalimaging algorithms. However, atomic-resolution 3D imaging in volumes largerthan the depth of field limit of the electron optics has so far been out ofreach. Electron ptychography, a computational imaging method allowing to solvethe multiple-scattering problem from position- and momentum-resolvedmeasurements, provides the opportunity to surpass this limit. Here, weexperimentally demonstrate atomic resolution three-dimensional phase-contrastimaging in a volume surpassing the depth of field limits using multi-sliceptychographic electron tomography. We reconstruct tilt-series 4D-STEMmeasurements of a Co3O4 nanocube, yielding 1.75 {\AA} resolution in areconstructed volume of (18.2nm)^3.

High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography