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Lightwave-driven terahertz scanning tunnelling microscopy (THz-STM) iscapable of exploring ultrafast dynamics across a wide range of materials withangstrom resolution. In contrast to scanning near-field optical microscopy,where photons scattered by the tip apex are analyzed to access the localdielectric function on the nanoscale, THz-STM uses a strong-field single-cycleterahertz pulse to drive an ultrafast current across a tunnel junction, therebyprobing the local density of electronic states. Yet, the terahertz field in aTHz-STM junction may also be spectrally modified by the electromagneticresponse of the sample. Here, we demonstrate a reliable and self-consistentapproach for terahertz near-field waveform acquisition in an atomic tunneljunction that can be generally applied to electrically conductive surfaces. Bycombining waveform sampling and tailoring with terahertz scanning tunnellingspectroscopy (THz-STS), we comprehensively characterize the tunnel junction anddistinguish local sample properties from effects due to terahertz pulsecoupling and field enhancement. Through modelling, we verify the presence of anisolated unipolar terahertz-induced current pulse, facilitating straightforwardinterpretation for differential THz-STS with high spectral resolution. Finally,we demonstrate the feasibility of atomic-scale terahertz time-domainspectroscopy via the extremely localized near-fields in the tunnel junction.

Atomic-Scale Terahertz Near Fields for Ultrafast Tunnelling Spectroscopy