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As the brightness of synchrotron radiation (SR) light sources improves, theoperation stability of light sources is weakened. To explore various beaminstability related issues in light sources, one transverse beam diagnosticssystem for bunch-by-bunch (BbB) profile measurement has been established atHefei Light Source-II (HLS-II). In this paper, one in-situ extraction algorithmin the data processing backend of the system is developed for BbB profiles, soas to provide important beam information of the machine operation in time.

One In-Situ Extraction Algorithm for Monitoring Bunch-by-Bunch Profile in the Storage Ring