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Atomic force microscope (AFM) generally works on the basis of manipulatingabsolute magnitude of van der Waals (vdW) force between the tip and specimen.The force is, however, less sensitive to alternation of atom species than totip-sample separations, resulting in the difficulty of compositionalidentification, even under multi-modal strategies and other AFM variations.Here, we report a phenomenon of light enhancement of van der Waals force (LvF),and the enhancement factor is found specific to materials. The force differenceprior and after illumination, instead of the tip-specimen force itself, isemployed for discriminating heterogeneous phases. The corresponding LvFmicroscopy (LvFM) demonstrates not only a ultra-high compositional resolutionrepresented by 20 dB enhancement factor and 150 times of the detection limit,but also a sub-10 nm lateral spatial resolution much smaller than the tip sizeof 20 nm. The simplicity of the opto-thermal mechanism, minuteness ofexcitation light power and wide availability of boosting lasers at variouswavelengths imply broad applications of LvFM on nano-materialscharacterization, particularly on two-dimensional semiconductors that arepromising as new generation of chip materials.

Light-enhanced van der Waals force microscopy