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The discovery that memory of particle configurations and plastic events canbe stored in amorphous solids subject to oscillatory shear has spurred researchinto methods for storing and retrieving information from these materials.However, it is unclear to what extent the ability to store memory is affectedby thermal fluctuations and other environmental noises, which are expected tobe relevant in realistic situations. Here, we show that while memory has a longlifetime at low temperatures, thermal fluctuations eventually lead to acatastrophic loss of memory, resulting in the erasure of most or all of thestored information within a few forcing cycles. We observe that an escape fromthe memory-retaining state (limit cycle) is triggered by a change in theswitching of plastic events, leading to a cascade of new plastic events thatwere not present in the original limit cycle. The displacements from the newplastic events change the particle configuration which leads to the loss ofmemory. We further show that the rate of escaping from a limit cycle increasesin a non-Arrhenius manner as a function of temperature, and the probability ofstaying in a limit cycle decays exponentially with an increase in the shearingfrequency. These results have important implications for memory storage sinceincreasing the temperature offers a means of effectively erasing existingmemories and allowing for the imprinting of new ones that can then be storedfor a long time at low temperatures.

Memory switching due to thermal noise in amorphous solids subject to cyclic shear