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Recently, interest in anti-bunched electron beams has surged because of theirpotential in free electron quantum optics and electron microscopy. However, thelimited temporal resolution of available detectors poses a challenge inobserving the statistics of such beams. We propose a novel method to measurethe arrival time statistics of continuous electron beams with sub-psresolution. We developed a 2D streak camera based on the combination ofRF-cavity-based electron beam deflection and fast single electron imaging. Weobserved Poissonian statistics within time bins from 100~ns to 1~ns andincreasingly pronounced sub-Poissonian statistics as the time bin decreasesfrom 2~ps to 340~fs.

Direct Observation of Sub-Poissonian Temporal Statistics in a Continuous Free Electron Beam with Sub-picosecond Resolution