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Electrical triggering of a metal-insulator transition (MIT) often results inthe formation of characteristic spatial patterns such as a metallic filamentpercolating through an insulating matrix or an insulating barrier splitting aconducting matrix. When the MIT triggering is driven by electrothermal effects,the temperature of the filament or barrier can be substantially higher than therest of material. Using x-ray microdiffraction and dark-field x-ray microscopy,we show that electrothermal MIT triggering leads to the development of aninhomogeneous strain profile across the switching device, even when thematerial does not undergo a 1st order structural phase transition coincidingwith the MIT. Diffraction measurements further reveal evidence of latticedistortions and twinning occurring within the MIT switching device,highlighting a qualitative distinction between the electrothermal process andequilibrium thermal lattice expansion in nonlinear electrical systems.Electrically induced strain development, lattice distortions, and twinningcould have important contributions in the MIT triggering process and coulddrive the material into non-equilibrium states, providing an unconventionalpathway to explore the phase space of strongly correlated electronic systems.

Local strain inhomogeneities during the electrical triggering of a metal-insulator transition revealed by the x-ray microscopy