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We propose the Self Returning Excluded Volume (SR-EV) model for the structureof chromatin based on stochastic rules and physical interactions that is ableto capture the observed behavior across imaging and sequencing based measuresof chromatin organization. The SR-EV model takes the return rules of the SelfReturning Random Walk, incorporates excluded volume interactions, chainconnectivity and expands the length scales range from 10 nm to over 1 micron.The model is computationally fast and we created thousands of configurationsthat we grouped in twelve different ensembles according to the two mainparameters of the model. The analysis of the configurations was done in a waycompletely analogous to the experimental treatments used to determine chromatinvolume concentration, contact probability, packing domain identification andsize characterization, and packing scaling behavior. We find a robust agreementbetween the theoretical and experimental results. The overall organization ofthe model chromatin is corrugated, with dense packing domains alternating witha very dilute regions in a manner that resembles the mixing of two disorderedbi-continuous phases. The return rules combined with excluded volumeinteractions lead to the formation of packing domains. We observed a transitionfrom a short scale regime to a long scale regime occurring at genomicseparations of $\sim 4\times 10^4$ base pairs or $\sim$ 100 nm in distance. Thecontact probability reflects this transition with a change in the scalingexponent from larger than -1 to approximately -1. The analysis of the paircorrelation function reveals that chromatin organizes following a power lawscaling with exponent $D \in \{2,3\}$ in the transition region between theshort and long distance regimes.

Local Volume Concentration, Packing Domains and Scaling Properties of Chromatin