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Scattering-type scanning near-field optical microscopy is becoming a premiermethod for the nanoscale optical investigation of materials well beyond thediffraction limit. A number of popular numerical methods exist to predict thenear-field contrast for axisymmetric configurations of scatterers on a surfacein the quasi-electrostatic approximation. Here, a fully electrodynamic approachis given for the calculation of near-field contrast of several scatterers inarbitrary configuration, based on the generalized Mie scattering method.Examples for the potential of this new approach are given by showing thecoupling of hyperbolic phonon polaritons in hexagonal boron nitride layers andshowing enhanced scattering in core-shell systems. In general, this methodenables the numerical calculation of the near-field contrast in a variety ofstrongly resonant scatterers and is able to accurately recreate spatialnear-field maps.

Generalized Mie theory for full-wave numerical calculations of scattering near-field optical microscopy with arbitrary geometries