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Polymeric materials are widely used in industries ranging from automotive tobiomedical. Their mechanical properties play a crucial role in theirapplication and function and arise from the nanoscale structures andinteractions of their constitutive polymer molecules. Polymeric materialsbehave viscoelastically, i.e. their mechanical responses depend on the timescale of the measurements; quantifying these time-dependent rheologicalproperties at the nanoscale is relevant to develop, for example, accuratemodels and simulations of those materials, which are needed for advancedindustrial applications. In this paper, an atomic force microscopy (AFM) methodbased on the photothermal actuation of an AFM cantilever is developed toquantify the nanoscale loss tangent, storage modulus, and loss modulus ofpolymeric materials. The method is then validated on a styrene-butadiene rubber(SBR), demonstrating the method's ability to quantify nanoscale viscoelasticityover a continuous frequency range up to five orders of magnitude (0.2 Hz to20,200 Hz). Furthermore, this method is combined with AFM viscoelastic mappingobtained with amplitude-modulation frequency-modulation (AM-FM) AFM, enablingthe extension of viscoelastic quantification over an even broader frequencyrange, and demonstrating that the novel technique synergizes with preexistingAFM techniques for quantitative measurement of viscoelastic properties. Themethod presented here introduces a way to characterize the viscoelasticity ofpolymeric materials, and soft matter in general at the nanoscale, for anyapplication.

Nanoscale rheology: Dynamic Mechanical Analysis over a broad and continuous frequency range using Photothermal Actuation Atomic Force Microscopy