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Charge density waves (CDW) have been reported in NdNiO$_2$ and LaNiO$_2$ thinfilms grown on SrTiO$_3$ substrates using Ni-$L_3$ resonant x-ray scattering inRefs. [1-3]. In their comment [arXiv:2306.15086] on these reports, Pelliciariet al. found no evidence for a CDW in a NdNiO$_2$ film by performingfixed-momentum energy-dependent measurements. Instead, they observed a nearbynon-resonant scattering peak, attributed to the (101) substrate reflection,made accessible at Ni-$L_3$ due to third harmonic light contamination. Here wepresent fixed-momentum energy-dependent resonant inelastic x-ray scatteringmeasurements across Ni-$L_3$ on NdNiO$_2$, used in the preceding study [1]. Wesee intrinsic Ni-$L_3$ energy profiles at all measured \textbf{Q} values,including a strong resonance effect at $\mathbf{Q}_\mathrm{CDW} = (-1/3, 0,0.316)$ reciprocal lattice units. Attempts to measure the (101) substrate peakusing third harmonic light at Ni-$L_3$ at I21, Diamond were unfruitful. Ourresults clearly demonstrate the electronic origin of the scattering peakpublished in Ref. [1] and lack of a detectable structural component in thepeak.

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