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High quality scanning transmission electron microscopy (STEM) dataacquisition and analysis has become increasingly important due to thecommercial demand for investigating the properties of complex materials such asbattery cathodes; however, multidimensional techniques (such as 4-D STEM) whichcan improve resolution and sample information are ultimately limited by thebeam-damage properties of the materials or the signal-to-noise ratio of theresult. subsampling offers a solution to this problem by retaining high signal,but distributing the dose across the sample such that the damage can bereduced. It is for these reasons that we propose a method of subsampling for4-D STEM, which can take advantage of the redundancy within said data torecover functionally identical results to the ground truth. We apply theseideas to a simulated 4-D STEM data set of a LiMnO2 sample and we obtained highquality reconstruction of phase images using 12.5% subsampling.

In silico Ptychography of Lithium-ion Cathode Materials from Subsampled 4-D STEM Data