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The properties of porous glasses and their field of application stronglydepend on the characteristics of the void space. Understanding the relationshipbetween their porous structure and failure behaviour can contribute to thedevelopment of porous glasses with long-term reliability optimized for specificapplications. In the present work, we used X-ray computed tomography withnanometric resolution (nano-CT) to image a controlled pore glass (CPG) with 400nm-sized pores whilst undergoing uniaxial compression in-situ to emulate astress process. Our results show that in-situ nano-CT provides an idealplatform for identifying the mechanisms of damage within glass with pores of400 nm, as it allowed the tracking of the pores and struts change of shapeduring compression until specimen failure. We have also applied computationaltools to quantify the microstructural changes within the CPG sample by mappingthe displacements and strain fields, and to numerically simulate the behaviourof the CPG using a Fast Fourier Transform/phase-field method. Both experimentaland numerical data show local shear deformation, organized along bands,consistent with the appearance and propagation of +/- 45 degrees cracks.

Intermittent in-situ high-resolution X-ray microscopy of 400-nm porous glass under uniaxial compression: study of pore changes and crack formation