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This manuscript demonstrates the theory, design, and simulation of scatteringscanning near field microscopy (s-SNOM) in 0.5THz. A comprehensive simulationmodel of nanotips' geometry, sample materials, and incident field isestablished to significantly improve the scattering efficiency and spatialresolution to achieve optimal performance. The theoretical model is based onfull-wave simulation and dipole moment analysis which can describe the overallnanotip's geometry information to screen the optimal parameters correspondingto the 0.5THz, which is the center frequency of most THz sources. Thecustomized nanotip can achieve 40 nm $(\lambda / 15000)$ spatial resolutionwhile maintaining an excellent scattering efficiency. This nanotip designmethod doesn't depend on the homogenization commercial AFM tips, providing anapproach for customized nanotip design of THz wave scattering near fieldmicroscopy.

Nanotips for 0.5THz scattering scanning near field microscopy