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We propose a novel x-ray imaging system, Multi-Image X-ray InterferometerModule (MIXIM), with which a very high angular resolution can be achieved evenwith a small system size. MIXIM is composed of equally-spaced multiple slitsand an x-ray detector, and its angular resolution is inversely proportional tothe distance between them. Here we report our evaluation experiments of MIXIMwith a newly adopted CMOS sensor with a high spatial resolution of 2.5 {\mu}m.Our previous experiments with a prototype MIXIM were limited to one-dimensionalimaging, and more importantly, the achieved angular resolution was only{\sim}1", severely constrained due to the spatial resolution of the adoptedsensor with a pixel size of 4.25 {\mu}m. By contrast, one-dimensional imagesobtained in this experiment had a higher angular resolution of 0.5" when aconfigured system size was only {\sim}1 m, which demonstrates that MIXIM cansimultaneously realize a high angular resolution and compact size. We alsosuccessfully obtained a two-dimensional profile of an x-ray beam for the firsttime for MIXIM by introducing a periodic pinhole mask. The highest angularresolution achieved in our experiments is smaller than 0.1" with a mask-sensordistance of 866.5 cm, which shows the high scalability of MIXIM.

Multi-Image X-ray Interferometer Module: I. design concept and proof-of-concept experiments with fine-pitch slits