English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Fast measurements of quantum devices is important in areas such as quantumsensing, quantum computing and nanodevice quality analysis. Here, we develop asuperconductor-semiconductor multi-module microwave assembly to demonstratecharge state readout at the state-of-the-art. The assembly consist of asuperconducting readout resonator interfaced to a silicon-on-insulator (SOI)chiplet containing quantum dots (QDs) in a high-$\kappa$ nanowire transistor.The superconducting chiplet contains resonant and coupling elements as well as$LC$ filters that, when interfaced with the silicon chip, result in a resonantfrequency $f=2.12$~GHz, a loaded quality factor $Q=680$, and a resonatorimpedance $Z=470$~$\Omega$. Combined with the large gate lever arms of SOItechnology, we achieve a minimum integration time for single and double QDtransitions of 2.77~ns and 13.5~ns, respectively. We utilize the assembly tomeasure charge noise over 9 decades of frequency up to 500~kHz and find a 1/$f$dependence across the whole frequency spectrum as well as a charge noise levelof 4~$\mu$eV/$\sqrt{\text{Hz}}$ at 1~Hz. The modular microwave circuitrypresented here can be directly utilized in conjunction with other quantumdevice to improve the readout performance as well as enable large bandwidthnoise spectroscopy, all without the complexity of superconductor-semiconductormonolithic fabrication.

Multi-module microwave assembly for fast read-out and charge noise characterization of silicon quantum dots