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This contribution discusses the results of an in-situ angular XPS study onthe thermal evolution of the native oxide layer on Nb3Sn and pure Nb. XPS datawere recorded with conventional spectrometers using an AlK(alpha) X-ray sourcefor spectra collected up to 600 C, and an MgK(Alpha) X-rays source fortemperatures above 600 C. The effect of the thickness, composition, and thermalstability of that oxide layer is relevant to understanding the functionalproperties of superconducting radiofrequency (SRF) cavities used in particleaccelerators. There is a consensus that oxide plays a role in surfaceresistance (Rs). The focus of this study is Nb3Sn, which is a promisingmaterial that is used in the manufacturing of superconducting radiofrequency(SRF) cavities as well as in quantum sensing, and pure Nb, which was includedin the study for comparison. The thermal evolution of the oxide layer in thesetwo materials is found to be quite different, which is ascribed to theinfluence of the Sn atom on the reactivity of the Nb atom in Nb3Sn films. Nband Sn atoms in this intermetallic solid have different electronegativity, andthe Sn atom can reduce electron density around neighbouring Nb atoms in thesolid, thus reducing their reactivity for oxygen. This is shown in thethickness, composition, and thermal stability of the oxide layer formed onNb3Sn. The XPS spectra were complemented by grazing incident XRD patternscollected using the ESRF synchrotron radiation facility. The results discussedherein shed light on oxide evolution in the Nb3Sn compound and guide itsprocessing for potential applications of the Nb3Sn-based SRF cavities inaccelerators and other superconducting devices.

Selective thermal evolution of native oxide layer in Nb and Nb3Sn-coated SRF grade Nb: An in-situ angular XPS study