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The X-ray microscopy technique at the European X-ray free-electron laser(EuXFEL), operating at a MHz repetition rate, provides superior contrast andspatial-temporal resolution compared to typical microscopy techniques at otherX-ray sources. In both online visualization and offline data analysis formicroscopy experiments, baseline normalization is essential for furtherprocessing steps such as phase retrieval and modal decomposition. In addition,access to normalized projections during data acquisition can play an importantrole in decision-making and improve the quality of the data. However, thestochastic nature of XFEL sources hinders the use of existing flat-fliednormalization methods during MHz X-ray microscopy experiments. Here, we presentan online dynamic flat-field correction method based on principal componentanalysis of dynamically evolving flat-field images. The method is used for thenormalization of individual X-ray projections and has been implemented as anonline analysis tool at the Single Particles, Clusters, and Biomolecules andSerial Femtosecond Crystallography (SPB/SFX) instrument of EuXFEL.

Online dynamic flat-field correction for MHz Microscopy data at European XFEL