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The CMS silicon tracking system measures the trajectories of chargedparticles with a hit resolution of the order of microns in the pixel detectorand tens of microns in the strip detector. One of the most important inputs fortrack reconstruction is the precision with which the tracker geometry is known.Therefore the position, orientation, and curvature of each tracker sensor mustbe precisely determined. Changes in the operating conditions can causemovements in the different substructures and also in the sensors. Formaintaining the targeted precision, frequent corrections are needed, and theprocedure to determine these corrections is commonly referred to as trackeralignment. Due to accumulated radiation during data taking, the response of thesensors changes over time. This affects the local reconstruction of pixel hitsand consequently the result of the alignment procedure. In this contribution,the alignment procedure in CMS is introduced, as well as the dedicatedcalibration for the pixel local reconstruction. The effect of the change in thelocal reconstruction due to aging of the sensors on the alignment procedure isdiscussed.

Tracker alignment in CMS$:$interplay with pixel local reconstruction