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Multiple application-specific integrated circuits (ASIC) are required for thedetectors if their readout channels are larger than that of ASIC channels. Fora system with such a readout scheme, there is a need to configure channelsamong ASICs to achieve the lowest electronics noise and highest count rate. Inthis work, experiments were performed to investigate the performance of twodifferent readout configurations between two ASICs in a cross-strip cadmiumzinc telluride detector. A lower electronic noise level, better FWHM energyresolution performance, and higher count rate was found for the anode electrodestrips with each ASIC allocating half of the detector area when compared toallocating each ASIC channel to alternate anode channels.

Performance investigations of two channel readout configurations on the cross-strip cadmium zinc telluride detector