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Neutron reflectometry (NR) has emerged as a unique technique for theinvestigation of structure and magnetism of thin films of both biologicallyrelevant and magnetic materials. The advantage of NR with respect to many othersurface-sensitive techniques is its sub-nanometer resolution that enablesstructural characterizations at the molecular level. While in the case ofbio-relevant samples, NR can be used to probe thin films at buried interfaces,non-destructively, even adopting a complex sample environment. Whereas thepolarized version of NR is best suited for revealing the interface magnetismwith a sub-nanometer depth resolution. In this article, I will briefly describethe basic principle of NR with some applications of NR to both bio-relevantsamples and magnetic heterostructures.

Neutron Reflectometry: a technique for revealing emergent phenomena at interfaces in heterostructures