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Time-bin (TB) and energy-time (ET) entanglement are crucial resources forlong-distance quantum information processing. Recently, major efforts have beenmade to produce compact high-quality sources of TB/ET entangled photons basedon solid-state integrated technologies. However, these attempts failed to closethe so-called "post-selection loophole". Here, we present an integratedphotonic general Bell-test chip for genuine (i.e., free of the post-selectionloophole) TB and ET entanglement certification. We report a violation of a Bellinequality by more than 10 standard deviations using our device based on the"hug" interferometric scheme. The experiment also demonstrates that the hugscheme, previously exploited for ET entanglement, can also be used for genuineTB entanglement.

Certification of genuine time-bin and energy-time entanglement with integrated photonics