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X ray resonant magnetic scattering (XRMS) was used to characterize themagnetization of 2D arrays of trilayer submicron magnets. The interpretation ofthe data required the understanding of the morphology of the magnets which wasalso deduced from the scattered intensity. The magnets consisted of twomagnetostatically coupled ferromagnetic layers separated by a non-magneticspacer. The scattered intensity from the disks resulted to be dependent on thedisks surface curvature. This made the collected intensity at each Braggreflection (BR) to be correlated to the reflected light from locations of thedisk with the same angle of curvature. Due to this, quantitative informationwas obtained, averaged over the disks illuminated by x rays, of the variationsin thickness and magnetization across the entire area of the disks. Thisaveraged magnetization mapping of the disks served to study their vortexconfiguration in each of their magnetic layers, determining the averagelocation of the vortex, the chiral symmetry of its magnetic circulation, andthe specific locations where the vortex nucleation starts within the disks.Chiral asymmetry appeared in the disks when the field was oriented at anoblique angle with respect to the easy axis of the array. The local magneticsensitivity of the technique allowed to identify a non-centrosymmetricdistribution of the magnetization of the disks that explains the observedchiral asymmetry. Unexpectedly, the magnetic circulation sense of the vortexwas the same in both ferromagnetic layers. In addition, the magnetization ofthe buried layer was different in the descent branch than in the ascent branchof its hysteresis loops.

Morphology and Magnetic vortex chiral symmetry of 2D arrays of magnetic  trilayer disks with magnetostatic interlayer coupling determined by X ray  resonant magnetic scattering