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Networks of solution-processed nanomaterials are important for multipleapplications in electronics, sensing and energy storage/generation. While it isknown that network morphology plays a dominant role in determining the physicalproperties of printed networks, it remains difficult to quantify networkstructure. Here, we utilise FIB-SEM nanotomography to characterise themorphology of nanostructured networks. Nanometer-resolution 3D-images wereobtained from printed networks of graphene nanosheets of various sizes, as wellas networks of WS2 nanosheets, silver nanosheets and silver nanowires.Important morphological characteristics, including network porosity,tortuosity, pore dimensions and nanosheet orientation were extracted and linkedto network resistivity. By extending this technique to interrogate thestructure and interfaces within vertical printed heterostacks, we demonstratethe potential of this technique for device characterisation and optimisation.

3D-imaging of Printed Nanostructured Networks using High-resolution FIB-SEM Nanotomography