English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Zeolites have been used in industrial applications such as catalysts, ionexchangers, and molecular sieves because of their unique porous atomicstructures. However, the direct observation of zeolitic local atomic structuresvia electron microscopy is difficult owing to their low resistance to electronirradiation. Subsequently, the fundamental relationships between thesestructures and their properties remain unclear. A novel low-electron-doseimaging technique, optimum bright-field scanning transmission electronmicroscopy (OBF STEM) has recently been developed. It reconstructs images witha high signal-to-noise ratio and a dose efficiency approximately two orders ofmagnitude higher than that of conventional methods. Herein, we performedlow-dose atomic-resolution OBF STEM observations of an FAU-type zeolite,effectively visualizing all the atomic sites in its framework. Additionally,the complex local atomic structure of the twin boundaries in the zeolite wasdirectly characterized. The results of this study facilitate thecharacterization of the local atomic structures in many electron-beam-sensitivematerials.

Direct imaging of local atomic structures in zeolite using novel low-dose scanning transmission electron microscopy