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Circular aperture probes have been successfully used for high-resolutionnear-field microwave imaging. It has been established that circular apertureprobes could conceivably provide higher image fidelity compared to rectangularaperture probes used conventionally for near-field imaging. In this paper, itis proposed to further enhance the near-field imaging resolution andsensitivity by loading the circular aperture with a resonant iris. The proposedprobe herein operates in the X-band frequency range and exhibits very localizednear-field distribution at the opening of the iris. Consequently, its imagingresolution and sensitivity are enhanced compared to the conventional apertureprobes operating over the same frequency band. The imaging capability of theproposed probe is analyzed using 3D electromagnetic simulation, and itsperformance is validated experimentally. The efficacy of the proposed probe forhigh-resolution imaging is demonstrated by practical imaging dielectric andmetallic samples. Furthermore, the obtained images using the proposed probe arecompared to those acquired using conventional circular and rectangular apertureprobes. It will be demonstrated that the proposed probe provides highersensitivity and resolution compared to the conventional aperture probes.

High Resolution Near Field Microwave Imaging using Loaded Circular Aperture Probe