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We demonstrate that the method of characterizing viscoelastic materials withAtomic Force Microscopy (AFM) by fitting analytical models to force-distance(FD) curves often yields conflicting and physically unrealistic results.Because this method involves specifying a constitutive time-dependentviscoelastic model and then fitting said model to the experimental data, weshow that the inconsistencies in this method are due to a lack of sensitivityof the model with respect to its parameters. Using approaches from informationtheory, this lack of sensitivity can be interpreted as a narrowed distributionof information which is obtained from the experiment. Furthermore, theequivalent representation of the problem in the frequency domain, achieved viamodified Fourier transformation, offers an enhanced sensitivity through awidening of the information distribution. Using these distributions, we thendefine restrictions for the timescales which can be reliably accessed in boththe time and frequency domains, which leads to the conclusion that the analysisof experiments in the time domain can frequently lead to inaccuracies. Finally,we provide an example where we use these restrictions as a guide to optimallydesign an experiment to characterize a polydimethylsiloxane (PDMS) polymersample.

Optimizing the Accuracy of Viscoelastic Characterization with AFM Force-Distance Experiments in the Time and Frequency Domains