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Nuclear recoils in crystal detectors generate radiation damage in the form ofcrystal defects that can be measured in scientific-grade CCDs as local hotspots of leakage current stimulated by temperature increases in the devices. Inthis proceeding, we use a neutron source to generate defects in DAMIC-M CCDs,and using increases in leakage current at different temperatures, wedemonstrate a procedure for identifying crystal defects in the CCDs of theDAMIC-M experiment. This is the first time that individual defects generatedfrom nuclear recoils have been studied. This technique could be used todistinguish nuclear recoils from electron recoils in some energy ranges, whichwould improve the ability of CCD detectors to search for weakly interactingdark matter.

Analysis of radiation damage in silicon charge-coupled devices used for dark matter searches