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Current, state-of-the-art CCDs are close to being able to deliver all keyperformance figures for future strategic X-ray missions except for the requiredframe rates. Our Stanford group is seeking to close this technology gap througha multi-pronged approach of microelectronics, signal processing and noveldetector devices, developed in collaboration with the Massachusetts Instituteof Technology (MIT) and MIT Lincoln Laboratory (MIT-LL). Here we report resultsfrom our (integrated) readout electronics development, digital signalprocessing and novel SiSeRO (Single electron Sensitive Read Out) devicecharacterization.

X-ray speed reading: enabling fast, low noise readout for next-generation CCDs